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Yuri A Plotnikov

from Chesterfield, VA
Age ~62
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Also known as:
Yuri Plotnikova
Phone and address:
7630 Hampton Green Dr, Chesterfield, VA 23832
(518) 346-3768
Related to:
Elizaveta Y Plotnikov, 37Olga K Plotnikov, 61Nina Plotnikov, 28
Connected to:
Aleksei V Plotnikov, 59Michael Plotno, 68Joel R Plotsky, 61Steven S Plotsky, 87Abby R Plott, 26Audrey M Plott, 46Beverly A Plott, 76Cassie M Plott, 42Clarideth J Plott, 88Deborah D Plott, 51

Yuri Plotnikov Phones & Addresses

  • 7630 Hampton Green Dr, Chesterfield, VA 23832 (518) 346-3768
  • 1317 Rowe Rd, Schenectady, NY 12309 (518) 346-3768
  • Niskayuna, NY
  • Yorktown, VA
  • 44 Hollandale Ln, Clifton Park, NY 12065 (518) 383-2029
  • Pittsburgh, PA

Work

Company: Ge research Mar 2000 Position: Res. sci.

Education

Degree: Master of Business Administration, Masters School / High School: Duquesne University 1994 to 1996

Skills

Signal Processing • Sensors • Ndt • Corrosion • R&D • Electronics • Engineering • Materials • Simulations • Materials Science • Physics • Image Analysis • Matlab • Research and Development • Engineering Management • Labview • Design of Experiments • Characterization • Infrared Thermography • Six Sigma • Product Development • Manufacturing • Project Management • Cross Functional Team Leadership • Testing • Research • Mri Coils

Industries

Research

Resumes

Resumes

Yuri Plotnikov Photo 1

Senior Research Engineer | Adaptive Automation

Location:
1317 Rowe Rd, Schenectady, NY 12309
Industry:
Research
Work:
GE Research since Mar 2000
Res. Sci.
Education:
Duquesne University 1994 - 1996
Master of Business Administration, Masters Moscow Power Engineering Institute (Technical University) 1991
Doctorates, Doctor of Philosophy, Philosophy Moscow Power Engineering Institute (Technical University) 1985
Master of Science, Masters, Electronics Engineering
Skills:
Signal Processing
Sensors
Ndt
Corrosion
R&D
Electronics
Engineering
Materials
Simulations
Materials Science
Physics
Image Analysis
Matlab
Research and Development
Engineering Management
Labview
Design of Experiments
Characterization
Infrared Thermography
Six Sigma
Product Development
Manufacturing
Project Management
Cross Functional Team Leadership
Testing
Research
Mri Coils

Publications

Us Patents

Pulsed Eddy Current Two-Dimensional Sensor Array Inspection Probe And System

US Patent:
6720775, Apr 13, 2004
Filed:
Jun 12, 2001
Appl. No.:
09/681824
Inventors:
Yuri Alexeyevich Plotnikov - Niskayuna NY
Shridhar Champaknath Nath - Niskayuna NY
Curtis Wayne Rose - Mechanicville NY
Thomas James Batzinger - Burnt Hills NY
Kenneth Gordon Herd - Schenectady NY
Assignee:
General Electric Company - Niskayuna NY
International Classification:
G01R 3128
US Classification:
324529, 324238, 324242
Abstract:
A pulsed eddy current two-dimensional sensor array probe for electrically conducting component inspection includes a drive coil disposed adjacent to a structure under inspection, a pulse generator connected to the drive coil and operable to energize in a pulsed manner the drive coil to transmit transient electromagnetic flux into the structure under inspection, and an array of sensors arranged in a two-dimensional array and substantially surrounded by the drive coil and operable to sense and generate output signals from the transient electromagnetic flux in the structure under inspection.

Pulsed Eddy Current Sensor Probes And Inspection Methods

US Patent:
6911826, Jun 28, 2005
Filed:
Dec 3, 2003
Appl. No.:
10/727401
Inventors:
Yuri Alexeyevich Plotnikov - Niskayuna NY, US
Thomas James Batzinger - Burnt Hills NY, US
Shridhar Champaknath Nath - Niskayuna NY, US
Sandeep Kumar Dewangan - Krnataka, IN
Carl Stephen Lester - Porter Corners NY, US
Kenneth Gordon Herd - Schenectady NY, US
Curtis Wayne Rose - Mechanicville NY, US
Assignee:
General Electric Company - Niskayuna NY
International Classification:
G01N027/82
G01R033/12
G01R033/00
G01R031/28
US Classification:
324529, 324240, 324242, 324238, 324262
Abstract:
A pulsed eddy current sensor probe includes a sensor array board. A number of sensors are arranged on the sensor array board and are operable to sense and generate output signals from the transient electromagnetic flux in a part being inspected. Each of the sensors has a differential output with a positive and a negative output. At least one drive coil is disposed adjacent to the sensors and is operable to transmit transient electromagnetic flux into the part. A first and a second multiplexer are arranged on the sensor array board and are operable to switch between the sensors. The first and second multiplexers are connected to the positive and negative outputs of the sensors, respectively.

Methods And Apparatus For Inspection Utilizing Pulsed Eddy Current

US Patent:
7005851, Feb 28, 2006
Filed:
Sep 30, 2003
Appl. No.:
10/675822
Inventors:
Andrew May - Schenectady NY, US
Changting Wang - Schenectady NY, US
Yuri Alexeyevich Plotnikov - Niskayuna NY, US
Assignee:
General Electric Company - Niskayuna NY
International Classification:
G01N 27/72
US Classification:
324228, 324716, 324242, 32420712, 73 38, 345174
Abstract:
In some aspects, the present invention provides a method for estimating at least one measurement/object property of a metal object. The method includes generating a time-varying eddy current in a wall of the metal object utilizing a pulsed-signal transmitter. The method further includes measuring the time-varying eddy current, fitting the time-varying measured eddy current to a parameterized polynomial, and interpreting the parameterized polynomial to determine one or more measurement/object properties of the metal object.

Omnidirectional Eddy Current Probe And Inspection System

US Patent:
7015690, Mar 21, 2006
Filed:
May 27, 2004
Appl. No.:
10/856381
Inventors:
Changting Wang - Schenectady NY, US
Yuri Alexeyevich Plotnikov - Niskayuna NY, US
Shridhar Champaknath Nath - Niskayuna NY, US
William Stewart McKnight - Hamilton OH, US
Gigi Olive Gambrell - West Chester OH, US
Assignee:
General Electric Company - Niskayuna NY
International Classification:
G01N 27/90
G01N 27/72
US Classification:
324240, 324243, 324260
Abstract:
An omnidirectional eddy current (EC) probe includes at least one EC channel having a first and a second sense coil that are offset in a first (x) and a second (y) direction and overlap in at least one of the directions (x,y). At least one drive coil is configured to generate a probing field for the EC channel in a vicinity of the sense coils. An omnidirectional EC inspection system includes an omnidirectional EC array probe (ECAP) that includes a number of EC channels and drive coils. Each EC channel includes first and second sense coils with opposite polarities. The drive coils have alternating polarities. Electrical connections perform differential sensing for respective EC channels. Corrective drive coils are disposed at respective ends of the EC channels and generate probing fields. An eddy current instrument is connected to the omnidirectional ECAP and receives differential sensing signals from the EC channels.

Eddy Current Probe And Inspection Method

US Patent:
7154265, Dec 26, 2006
Filed:
Dec 21, 2004
Appl. No.:
11/019343
Inventors:
Mottito Togo - Bangalore, IN
Changting Wang - Schenectady NY, US
Yuri Alexeyevich Plotnikov - Niskayuna NY, US
Shyamsunder Tondanur Mandayam - Bangalore, IN
William Stewart McKnight - Hamilton OH, US
Walter Joseph Bantz - West Chester OH, US
Ui Won Suh - Cincinnati OH, US
Assignee:
General Electric Company - Niskayuna NY
International Classification:
G01N 27/90
US Classification:
324239, 324242
Abstract:
An eddy current (EC) probe for inspecting a component is provided. The EC probe includes a tangential drive coil configured to generate a probing field for inducing eddy currents in the component, where a portion of the eddy currents are aligned parallel to an edge of the component. An axis of the tangential drive coil is aligned parallel to a surface of the component. The EC probe further includes a pair of sense coils, where an axis of the sense coils is aligned perpendicular to the surface of the component. The sense coils are configured to sense the portion of the eddy currents aligned parallel to the edge of the component.

Inspection Systems And Methods Of Operation

US Patent:
7389206, Jun 17, 2008
Filed:
Aug 10, 2006
Appl. No.:
11/502199
Inventors:
Yuri Alexeyevich Plotnikov - Niskayuna NY, US
Assignee:
General Electric Company - Niskayuna NY
International Classification:
G06F 15/00
US Classification:
702189
Abstract:
A method for inspecting an object is provided. The method includes applying a pulsed excitation signal to the object and detecting a transient response signal to the pulsed excitation signal. The method also includes convolving the transient response signal with a plurality of orthogonal functions to generate a plurality of orthogonal components.

Pulsed Eddy Current Pipeline Inspection System And Method

US Patent:
7402999, Jul 22, 2008
Filed:
Nov 30, 2005
Appl. No.:
11/290916
Inventors:
Yuri Plotnikov - Niskayuna NY, US
Andrew May - Schenectady NY, US
Shridhar Nath - Niskayuna NY, US
Changting Wang - Niskayuna NY, US
Assignee:
General Electric Company - Niskayuna NY
International Classification:
G01N 27/72
US Classification:
324220
Abstract:
A pulsed eddy current pipeline inspection device is provided. The pulsed eddy current pipeline inspection device comprises a plurality of stages longitudinally spaced apart from each other and adapted to move between a contracted position and an expanded position, and a plurality of sensors disposed around at least a portion of a circumference of each of the plurality of stages in the contracted position with at least one gap between sensors in each of the plurality of stages in the expanded position, the plurality of sensors being arranged such that the at least one gap in a first one of the plurality of stages is aligned with a portion of a second one of the plurality of stages that has sensors disposed thereon.

Eddy Current System And Method For Estimating Material Properties Of Parts

US Patent:
7830140, Nov 9, 2010
Filed:
Aug 7, 2007
Appl. No.:
11/834759
Inventors:
Nilesh Tralshawala - Rexford NY, US
Yuri Alexeyevich Plotnikov - Niskayuna NY, US
Assignee:
General Electric Company - Niskayuna NY
International Classification:
G01R 33/14
G01R 35/00
G01N 27/72
US Classification:
324222, 324202, 324228
Abstract:
A method of inspecting a test part is provided. The method includes positioning an eddy current probe on a surface of the test part and scanning the test part using the eddy current probe to generate a first signal corresponding to a no lift-off condition of the test part. The method further includes positioning the eddy current probe at a pre-determined distance from the surface of the test part and scanning the test part using the eddy current probe positioned at the pre-determined distance from the test part to generate a second signal corresponding to a lift-off condition of the test part. The method also includes processing the first and second signals to estimate an electrical conductivity of the test part.
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Yuri A Plotnikov from Chesterfield, VA, age ~62 Get Report