Inventors:
Omar S. Khalil - Libertyville IL
Xiaomao Wu - Gurnee IL
Johannes Sake Kanger - Enschede, NL
Reneâ² Alexander Bolt - Enschede, NL
Shu-Jen Yeh - Grayslake IL
Charles F. Hanna - Libertyville IL
Frits Frans Maria de Mul - Almelo, NL
Assignee:
Abbott Laboratories - Abbott Park IL
International Classification:
A61B 500
US Classification:
2503418, 25033911, 356432, 600310, 600322, 600323
Abstract:
Apparatus and method for non-invasively measuring at least one optical parameter of a sample, particularly a sample of tissue that comprises a plurality of layers. The at least one parameter can be used to determine the presence or concentration of an analyte of interest in the sample of tissue. The apparatus and method of the present invention (1) measure light that is substantially reflected, scattered, absorbed, or emitted from a shallower layer of the sample of tissue, (2) measure light that is substantially reflected, scattered, absorbed, or emitted from a deeper layer of the sample of tissue, (3) determine at least one optical parameter for each of these layers, and (4) account for the effect of the shallower layer on the at least one optical parameter of the deeper layer. Specifying the sampling depth allows determinations of the optical properties of a specific layer of the sample of the tissue, e. g. , dermis, and decreases interference from other layers, e. g.