US Patent:
20060286676, Dec 21, 2006
Inventors:
James Van Camp - Glen Ellyn IL, US
John Hoots - St. Charles IL, US
John Holtslander - La Crosse WI, US
International Classification:
G01N 27/64
Abstract:
The invention pertains to a method for fluorometrically monitoring a Clean-In-Place (“CIP”) system and for fluorometrically monitoring the dosage of chemical added to the CIP system. Monitoring of the said CIP system can be based upon fluormetrically monitoring the fluorescent tracer, chemical or both, which are added to the CIP system.