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Christophe J Dorrer

from Rochester, NY
Age ~51
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Also known as:
Christopher J Dorrer, Christophe J Dorrers, Christophe J Doorer
Phone and address:
241 Ashley Dr, Rochester, NY 14620
(585) 355-2706
Connected to:
Amelia M Dorrer, 43Ronald Dorrestein, 62Brett S Dorrian, 40Susan DorricottBarry Dorrien, 71Brenda A Dorrien, 82Joshua W Dorries, 36Mariela M Dorries, 57Ruth E Dorrier, 52Sheila M Dorrier, 60

Christophe Dorrer Phones & Addresses

  • 241 Ashley Dr, Rochester, NY 14620 (585) 355-2706
  • 33 Aberdeen Rd, Matawan, NJ 07747 (732) 290-6683
  • 241 Ashley Dr, Rochester, NY 14620

Work

Company: University of rochester Sep 2005 Address: Rochester, New York Area Position: Senior scientist

Education

Degree: MBA School / High School: University of Rochester - William E. Simon Graduate School of Business Administration 2008 to 2011 Specialities: Finance, Competitive and Organizational Strategy

Skills

Optics • Characterization • Laser • Optical Engineering • R&D • Optical Fiber • Physics • Photonics • Laser Physics • Simulations • Signal Processing • Matlab • Spectroscopy • Science • Research • Image Processing • Data Analysis • Research and Development • Telecommunications • Optoelectronics • Optical Communications • Nonlinear Optics • Statistics • Sensors • Mathematical Modeling • Experimentation • Labview • Systems Engineering

Industries

Research

Resumes

Resumes

Christophe Dorrer Photo 1

Associate Editor-Optica

Location:
251 Quinby Rd, Rochester, NY 14623
Industry:
Research
Work:
University of Rochester - Rochester, New York Area since Sep 2005
Senior scientist
Aktiwave LLC - Rochester, New York Area since Mar 2008
Co-founder
The Optical Society since Nov 2009
Associate editor-Optics Express
Bell Laboratories Aug 2001 - Sep 2005
Member of Technical Staff
University of Rochester Nov 1999 - Aug 2001
Post-doctoral fellow
Education:
University of Rochester - William E. Simon Graduate School of Business Administration 2008 - 2011
MBA, Finance, Competitive and Organizational Strategy Ecole polytechnique 1996 - 1999
PhD, Optics Ecole polytechnique 1992 - 1995
Master of Engineering (Diplome d'Ingenieur) Lycee Pierre de Fermat 1989 - 1992
Baccalaureat and preparatory classes
Skills:
Optics
Characterization
Laser
Optical Engineering
R&D
Optical Fiber
Physics
Photonics
Laser Physics
Simulations
Signal Processing
Matlab
Spectroscopy
Science
Research
Image Processing
Data Analysis
Research and Development
Telecommunications
Optoelectronics
Optical Communications
Nonlinear Optics
Statistics
Sensors
Mathematical Modeling
Experimentation
Labview
Systems Engineering

Publications

Us Patents

Method And Apparatus For The Characterization Of Optical Pulses And Modulators

US Patent:
6856927, Feb 15, 2005
Filed:
Jan 8, 2003
Appl. No.:
10/338355
Inventors:
Christophe Jean Dorrer - Matawan NJ, US
Inuk Kang - Matawan NJ, US
Assignee:
Lucent Technologies Inc. - Murray Hill NJ
International Classification:
G06F019/00
US Classification:
702 76, 702 57, 702 70, 702126, 385 2, 385 5, 375242, 359237, 356 508, 356 511
Abstract:
A method and apparatus for the characterization of optical pulses and modulators includes modulating, using a modulator, a train of optical pulses, measuring a spectrum of the modulated train of optical pulses, recording the measured spectrum as an entry in a spectrogram at a position in the spectrogram corresponding to a relative delay between the modulation and the train of optical pulses, incrementing the relative delay, and repeating the above steps until the accumulated relative delay is equal to the period of the spectrogram. The train of optical pulses and the modulator are then characterized using the measured spectra recorded in the spectrogram.

Method And Apparatus For Characterizing Optical Pulses Using Reduced Complexity Chronocyclic Tomography

US Patent:
6885490, Apr 26, 2005
Filed:
May 1, 2003
Appl. No.:
10/427839
Inventors:
Christophe J. Dorrer - Matawan NJ, US
Inuk Kang - Matawan NJ, US
Assignee:
Lucent Technologies Inc. - Murray Hill NJ
International Classification:
H04B010/04
G02F001/01
US Classification:
359279, 359278
Abstract:
A method and apparatus for characterizing an optical pulse using a reduced complexity chronocyclic tomography is described. In one example, an optical pulse train is modulated using quadratic temporal phase modulation. A first spectral intensity of the optical pulse train is measured after a quadratic temporal phase modulation having a first amplitude. A second spectral intensity of the train of optical pulses is then measured in response to the quadratic temporal phase modulation having a second amplitude. At least one of the group delay and the spectral intensity associated with the train of optical pulses is computed using the first spectral intensity and the second spectral intensity.

Interferometric Method And Apparatus For The Characterization Of Optical Pulses

US Patent:
7006230, Feb 28, 2006
Filed:
May 16, 2003
Appl. No.:
10/439828
Inventors:
Christophe J. Dorrer - Matawan NJ, US
Inuk Kang - Matawan NJ, US
Assignee:
Lucent Technologies Inc. - Murray Hill NJ
International Classification:
G01B 9/02
US Classification:
356451, 356450
Abstract:
A method and apparatus for the characterization of an optical pulse includes splitting an optical pulse into two replicas separated by a delay, modulating at least one of the two replicas with a linear temporal phase modulation, measuring a spectrum of the modulated replicas, and characterizing the optical pulse using the measured spectra. In one embodiment of the present invention a spectral phase difference between the replicas is obtained from the measured spectrum using Fourier Transform Spectral Interferometry.

Method And Apparatus For Measurement Of Group Delay

US Patent:
7023556, Apr 4, 2006
Filed:
Jul 28, 2003
Appl. No.:
10/629379
Inventors:
Christophe J Dorrer - Matawan NJ, US
Assignee:
Lucent Technologies Inc. - Murray Hill NJ
International Classification:
G01B 9/02
US Classification:
356477, 356 731
Abstract:
A method and apparatus for measuring the group delay of a device are provided. The temporal and spectral intensities of optical pulses are measured after propagation in the device and the group delay of the device is determined using the measured intensities.

Linear Optical Sampling Method And Apparatus

US Patent:
7042629, May 9, 2006
Filed:
Feb 19, 2004
Appl. No.:
10/782003
Inventors:
Christopher Richard Doerr - Middletown NJ, US
Christophe J. Dorrer - Matawan NJ, US
Peter J. Winzer - Tinton Falls NJ, US
Assignee:
Lucent Technologies Inc. - Murray Hill NJ
International Classification:
G02F 2/00
G02F 1/01
H04B 10/06
US Classification:
359325, 359246, 398205, 398207
Abstract:
A linear optical sampling apparatus, temporally samples a modulated optical signal using the amplitude of the interference of its electric field with the electric field of a laser pulse. The apparatus includes a 90 optical hybrid that combines the optical signal and laser pulse in order to generate two quadratures interference samples Sand S. A processor compensates for optical and electrical signal handling imperfections in the hybrid, balanced detectors, and A/D converters used in the optical sampling apparatus. The processor numerically scales the two quadratures interference samples Sand Sover a large collection of samples by imposing that the average ==0 and = and then minimizes 2/(+) =cos(φ−φ). This is done by adjusting the phase between the two quadratures (ideally either −π/2 or +π/2) so that cos(φ−φ) is zero. The processor then generates a demodulated sample signal using the quadratures interference samples Sand S.

Method And Apparatus For Optical Sampling

US Patent:
7068411, Jun 27, 2006
Filed:
Jan 29, 2004
Appl. No.:
10/766977
Inventors:
Christophe J Dorrer - Matawan NJ, US
Inuk Kang - Matawan NJ, US
Assignee:
Lucent Technologies Inc. - Murray Hill NJ
International Classification:
G02F 1/03
H04B 10/04
US Classification:
359245, 359259, 359264, 398189, 398147
Abstract:
An optical sampling method and apparatus are provided for modulating an optical signal using a first electroabsorption modulator (EAM) driven by a sinusoidal RF voltage signal to provide substantially jitter free temporal gating of the optical signal. The gated optical signal from the first EAM is routed through a second EAM to provide an optical output signal having a reduced repetition rate. The second EAM is driven using an electrical pulse train having a repetition rate that is a subharmonic of the frequency of the sinusoidal RF voltage signal driving the first EAM.

Method And Apparatus For Optical Pulse Characterization Using Simplified Chronocyclic Tomography

US Patent:
7126739, Oct 24, 2006
Filed:
Feb 28, 2005
Appl. No.:
11/067777
Inventors:
Christophe J Dorrer - Matawan NJ, US
Inuk Kang - Matawan NJ, US
Assignee:
Lucent Technologies Inc. - Murray Hill NJ
International Classification:
G02F 1/01
US Classification:
359279, 359278
Abstract:
A method and apparatus for characterizing light from an optical source using simplified chronocyclic tomography by modulating the phase of light from an optical source using alternating positive and negative quadratic temporal phase modulation at a desired alternating frequency Ω; generating an electric signal proportional to the optical power of the modulated light after propagation through an optical frequency resolving device, for a desired optical frequency ω; determining a time-invariant and time-varying components of the electric signal; repeating the generating and determining steps for a plurality of optical frequencies; and determining the spectral phase and spectral intensity of the light from the optical source using the time-invariant and time-varying components determined for the plurality of optical frequencies.

Method And Apparatus For The Direct Characterization Of The Phase Of An Optical Signal

US Patent:
7133135, Nov 7, 2006
Filed:
Feb 20, 2004
Appl. No.:
10/783305
Inventors:
Christophe J. Dorrer - Matawan NJ, US
Assignee:
Lucent Technologies, Inc. - Murray Hill NJ
International Classification:
G01B 9/02
US Classification:
356450, 356 731
Abstract:
A method and apparatus for the direct characterization of the phase of an optical signal includes measuring the interference between the optical signal and a sequence of optical pulses and processing the measured interference. The method and apparatus split and combine the optical signal and the sequence of optical pulses in order to measure the real and imaginary part of the interference signal for a least two pulses from the sequence of optical pulses. Processing steps are disclosed to obtain phase information on the optical signal from the measured interference.
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Christophe J Dorrer from Rochester, NY, age ~51 Get Report