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Blaine D Johs

from Lincoln, NE
Age ~58
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Also known as:
Blaine Douglas Johs, Blaine S Johs, Blaine Douglas Johns, Blaire D Johs, Blain Johs, Johs Blain
Phone and address:
420 Chanceler Dr, Lincoln, NE 68521
Related to:
Daniel Johs, 33Blaire D Johs, 58Chelsea M Cunningham, 43Erica A Johs, 29Mark A Johns, 58Gail A Johs, 57
Connected to:
Jason S Johs, 50Jason N Johson, 29Jon Johson, 55Rick D JohsonRon T Johson, 51Pamela B Johstoneaux, 79Phillip M Joia, 44Richard M Joia, 50Elaine A Joice, 75Keith Joichin, 40

Blaine Johs Phones & Addresses

  • 420 Chanceler Dr, Lincoln, NE 68521
  • 224 Trail Head Trl, Dillon, CO 80435
  • Pleasanton, NE

Work

Company: Film sense 2013 Position: President

Education

Degree: Master of Science, Masters School / High School: University of Nebraska - Lincoln 1984 to 1989 Specialities: Electrical Engineering

Skills

Thin Films • Optics • Characterization • Ellipsometry • Materials Science • R&D • Nanotechnology • Semiconductors • Physics • Metrology • Nanomaterials • Spectroscopy • Design of Experiments • Labview • Sputtering • Afm • Cvd • Photovoltaics • Photolithography • Photonics • Nanofabrication • Research and Development

Industries

Research

Resumes

Resumes

Blaine Johs Photo 1

President

Location:
1226 south 23Rd St, Lincoln, NE 68503
Industry:
Research
Work:
Film Sense
President
J.a. Woollam Co., Inc. 1990 - 2013
Director of Research
Education:
University of Nebraska - Lincoln 1984 - 1989
Master of Science, Masters, Electrical Engineering
Skills:
Thin Films
Optics
Characterization
Ellipsometry
Materials Science
R&D
Nanotechnology
Semiconductors
Physics
Metrology
Nanomaterials
Spectroscopy
Design of Experiments
Labview
Sputtering
Afm
Cvd
Photovoltaics
Photolithography
Photonics
Nanofabrication
Research and Development

Business Records

Name / Title
Company / Classification
Phones & Addresses
Blaine Johs
Principal
Film Sense LLC
Motion Picture Services
420 W Chanceler Dr, Lincoln, NE 68521
Blaine Johs
Director of Engineering
J. A. Woollam Co., Inc
Mfg Analytical Instruments · Analytical Instruments · Ophthalmic Goods Mfg · Optical Goods-Manufacturers
645 M St, Lincoln, NE 68508
(402) 477-7501, (402) 477-8214

Publications

Us Patents

Regression Calibrated Spectroscopic Rotating Compensator Ellipsometer System With Pseudo-Achromatic Retarder System

US Patent:
6353477, Mar 5, 2002
Filed:
Feb 1, 2000
Appl. No.:
09/496011
Inventors:
Blaine D. Johs - Lincoln NE
Craig M. Herzinger - Lincoln NE
Assignee:
J. A. Woollam Co. Inc. - Lincoln NE
International Classification:
G01N 2121
US Classification:
356369
Abstract:
A Spectroscopic Rotating Compensator Material System Investigation System including a Dual Waveplate Pseudo-Achromatic Compensator System, and a Photo-Array for simultaneously detecting a Multiplicity of Wavelengths, is disclosed. The Spectroscopic Rotating Compensator Material System Investigation System is calibrated by a Mathematical Regression based technique involving, where desirable, Parameterization of Calibration Parameters. Calibration is possible utilizing various dimensional Data Set(s) obtained with the Spectroscopic Rotating Compensator Material System Investigation System in a âMaterial System presentâ or in a Straight-throughâ configuration, said data sets being variously normalized to D. C. , A. C. or combination D. C. and A. C. components thereof.

Rotating Compensator Ellipsometer System With Spatial Filter

US Patent:
6456376, Sep 24, 2002
Filed:
May 24, 2001
Appl. No.:
09/864840
Inventors:
Martin M. Liphardt - Lincoln NE
Blaine D. Johs - Lincoln NE
Craig M. Herzinger - Lincoln NE
Ping He - Lincoln NE
Assignee:
J.A. Woollam Co., Inc. - Lincoln NE
International Classification:
G01J 400
US Classification:
356369
Abstract:
Disclosed is the application of spatial filter(s) in rotating compensator ellipsometer systems prior to or after a sample system. The purpose is, for instance, to eliminate a radially outer annulus of a generally arbitrary Profile beam that presents with low intensity level irregular content, so that electromagnetic beam intensity is caused to quickly decay to zero as a function of radius.

Beam Splitting Analyzer Means In Rotating Compensator Ellipsometer

US Patent:
6483586, Nov 19, 2002
Filed:
Sep 10, 2001
Appl. No.:
09/950036
Inventors:
Blaine D. Johs - Lincoln NE
Craig M. Herzinger - Lincoln NE
Steven E. Green - Lincoln NE
Jeffrey S. Hale - Lincoln NE
Assignee:
J. A. Woollam Co. Inc. - Lincoln NE
International Classification:
G01N 2121
US Classification:
356369
Abstract:
Disclosed is a rotating compensator sample system investigation system which includes a source of a beam of electromagnetic radiation, a polarizer, a stage for supporting a sample system, a beam splitting analyzer, and at least two detector systems which are positioned each to intercept a different of the at least two electromagnetic beams which emerge from the beam splitting analyzer. Also disclosed is a regression based approach to calibration which simultaneously extracts a sample system PSI and DELTA.

Methods For Uncorrelated Evaluation Of Parameters In Parameterized Mathematical Model Equations For Lens Retardance, In Ellipsometry And Polarimetry Systems

US Patent:
6549282, Apr 15, 2003
Filed:
Oct 18, 1999
Appl. No.:
09/419794
Inventors:
Blaine D. Johs - Lincoln NE
Craig M. Herzinger - Lincoln NE
Ping He - Lincoln NE
Assignee:
J. A. Woollam Co. Inc. - Lincoln NE
International Classification:
G01B 1106
US Classification:
356369
Abstract:
Disclosed are ellipsometer and polarimeter systems which have multi-element input and output lenses that demonstrate essentially the same focal length at each wavelength in a spectroscopic range of wavelengths.

System And Method Of Improving Electromagnetic Radiation Beam Characteristics In Ellipsometer And The Like Systems

US Patent:
6590655, Jul 8, 2003
Filed:
Apr 23, 2001
Appl. No.:
09/840483
Inventors:
James D. Welch - Omaha NE
Blaine D. Johs - Lincoln NE
Martin M. Liphardt - Lincoln NE
Ping He - Lincoln NE
Assignee:
J.A. Woollam Co. Inc. - Lincoln NE
International Classification:
G01J 400
US Classification:
356369, 356 73, 356326, 356445
Abstract:
Disclosed are systems for, and methods of controlling radial energy density profiles in, and/or cross-section dimensioning of electromagnetic beams in polarimeters, ellipsometers, reflectometers and spectrophotometers.

Application Of Spectroscopic Ellipsometry To In Situ Real Time Fabrication Of Multiple Alternating High/Low Refractive Index Narrow Bandpass Optical Filters

US Patent:
6636309, Oct 21, 2003
Filed:
Jul 27, 2001
Appl. No.:
09/916836
Inventors:
Blaine D. Johs - Lincoln NE
Jeffrey S. Hale - Lincoln NE
Assignee:
J.A. Woollam Co. - Lincoln NE
International Classification:
G01J 400
US Classification:
356369, 356365
Abstract:
Application of selected wavelength range, oblique angle of incidence, reflection mode, spectroscopic ellipsometry DELTA data to monitor and/or control fabrication of multiple layer High/Low Refractive Index Narrow Bandpass Optical Filters, either alone or in combination with transmissive or reflective non-ellipsometric data obtained at an essentially normal angle of incidence.

Spectroscopic Ellipsometry Analysis Of Object Coatings During Deposition

US Patent:
6741353, May 25, 2004
Filed:
Jul 19, 2002
Appl. No.:
10/199536
Inventors:
Blaine D. Johs - Lincoln NE
Assignee:
J.A. Woollam Co., Inc. - Lincoln NE
International Classification:
G01N 2155
US Classification:
356445, 356369
Abstract:
Disclosed is methodology for determination of parameters which characterize parameters such as thickness, color or quality of films deposited onto objects of arbitrary shapes, utilizing spectroscopic ellipsometry applied to standard shaped objects.

Odd Bounce Image Rotation System In Ellipsometer Systems

US Patent:
6795184, Sep 21, 2004
Filed:
Sep 26, 2001
Appl. No.:
09/963573
Inventors:
Craig M. Herzinger - Lincoln NE
Steven E. Green - Lincoln NE
Blaine D. Johs - Lincoln NE
Assignee:
J.A. Woollam Co., INC - Lincoln NE
International Classification:
G01J 400
US Classification:
356369, 356364, 356365, 356368
Abstract:
Disclosed is an odd bounce image rotating system with a sequence of an odd number of reflecting elements, such that a polarized electromagnetic beam caused to enter, reflectively interacts with the odd number of reflecting elements and exits along an essentially non-deviated, non-displaced locus, but with an azimuthally rotated polarization state. Application to, and methodology of application to set azimuthal angles of polarization in spectroscopic ellipsometer, polarimeter and the like systems is also disclosed.
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Blaine D Johs from Lincoln, NE, age ~58 Get Report